Safety tester test device

Eaton Sefelec 506-S + 64-SC

Safety tester with scanner for high-voltage test station
Lsdpfsxqxw Tjx Agnohn

- EATON Sefelec 506-S
- EATON Sefelec 64-SC

The devices were purchased in 2023/2024 and are in top condition.

The SEFELEC 506-S test device for electrical safety testing, an EATON next-generation model, is based on ARM dual-core technology components and is controlled via DSP. This technology offers the operator optimal stability and repeatability of measurements.

The high accuracy and measurement speed are tailored to the requirements of quality assurance in production and incoming goods inspection.
The sequence function facilitates the operation of the SEFELEC 506-S test station when integrated into a test stand or test bench.
The 7” touchscreen of the new SEFELEC model series impresses with simple and intuitive operation.

- Standard interfaces: Ethernet / RS232 / USB / PLC
- Optional: IEEE488-2 interface
- Dual safety circuit SIL2
- Automatic selection of test series
- Sequence mode for combining multiple consecutive tests

Voltage withstand at 5kVAC 500VA and 6kVDC
Detection modes by current threshold or current fluctuations (ΔI)
Burn function mode without current detection
Megohmmeter 200 GΩ, test voltage from 20 VDC to 1000 VDC
Optional: 2TΩ range
PE measurement at 32A - 8VAC, measurement 0 ... 1Ω
Optional: test current 50A
Programmable test ramps
Ramp up, hold, ramp down
Multi-ramp mode, up to 7 steps
TFT touchscreen 7”, 16 million colors, for programming, as well as for displaying ongoing tests and results
Integrated ARM dual core control & Nand 3D technology for optimal accuracy, stability and repeatability
Integrated DSP enables higher test speeds
Large internal memory for storing configurations and test results
Completely compliant with IEC 61010-2-034 (safety requirements for test and measurement equipment for insulation resistance measurement and equipment for voltage withstand testing)

Shipping is possible subject to prior agreement.

#8312-2

آگهی به صورت خودکار ترجمه شده است. احتمال بروز اشتباه در ترجمه وجود دارد.