Field emission scanning electron microscope

JEOL JSM-IT800is

Description (detailed configuration):
o 5-axis stage
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o Modern, expandable user interface with EDX integration and image composition
o SE detector
o Scintillator BSE detector (retractable)
o In-Lens detector
o Low vacuum system with BSE detector (retractable)
o Fully software-integrated JEOL-EDX system (60mm²)
o In-column current measurement
o Navigation camera
o Live camera
o Control console
o Desk, PC with Windows OS, 2 x 24" monitors, keyboard

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