Scanning Electron Microscope (Tabletop)

JEOL JCM-7000

The JCM-7000 combines simple sample navigation with a range of advanced automatic functions. A large sample chamber, high resolution, and an optional low vacuum mode for non-conductive samples make this desktop SEM a versatile, mobile all-rounder.

Features:
• SE/BSE detection
• Magnification up to x100,000, resolution approx. 8 nm
• Low vacuum operation for non-conductive samples
• Hardware and software integrated EDX system for elemental characterization
• Live elemental analysis, live imaging (including 3D imaging/topography)
• Intuitive operation with recipes, automatic functions, image montages, etc.
• Large chamber for samples up to 80 mm diameter and 50 mm height
• Compact & mobile
• Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H
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